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Embedded Memories for Nano-Scale VLSIs

Release on 2009-04-212009-04-21 by Kevin Zhang
Embedded Memories for Nano-Scale VLSIs

Author: Kevin Zhang

Publisher: Springer Science & Business Media

ISBN: 0387884971

Category: Technology & Engineering

Page: 400

View: 809

Kevin Zhang Advancement of semiconductor technology has driven the rapid growth of very large scale integrated (VLSI) systems for increasingly broad applications, incl- ing high-end and mobile computing, consumer electronics such as 3D gaming, multi-function or smart phone, and various set-top players and ubiquitous sensor and medical devices. To meet the increasing demand for higher performance and lower power consumption in many different system applications, it is often required to have a large amount of on-die or embedded memory to support the need of data bandwidth in a system. The varieties of embedded memory in a given system have alsobecome increasingly more complex, ranging fromstatictodynamic and volatile to nonvolatile. Among embedded memories, six-transistor (6T)-based static random access memory (SRAM) continues to play a pivotal role in nearly all VLSI systems due to its superior speed and full compatibility with logic process technology. But as the technology scaling continues, SRAM design is facing severe challenge in mainta- ing suf?cient cell stability margin under relentless area scaling. Meanwhile, rapid expansion in mobile application, including new emerging application in sensor and medical devices, requires far more aggressive voltage scaling to meet very str- gent power constraint. Many innovative circuit topologies and techniques have been extensively explored in recent years to address these challenges.
Technology & Engineering
Embedded Memories for Nano-Scale VLSIs
Language: en
Pages: 400

Embedded Memories for Nano-Scale VLSIs

Authors: Kevin Zhang
Categories: Technology & Engineering
Type: BOOK - Published: 2009-04-21 - Publisher: Springer Science & Business Media

Kevin Zhang Advancement of semiconductor technology has driven the rapid growth of very large scale integrated (VLSI) systems for increasingly broad applications, incl- ing high-end and mobile computing, consumer electronics such as 3D gaming, multi-function or smart phone, and various set-top players and ubiquitous sensor and medical devices. To meet
Extreme Statistics in Nanoscale Memory Design
Language: en
Pages: 246

Extreme Statistics in Nanoscale Memory Design

Authors: Amith Singhee, Rob A. Rutenbar
Categories: Technology & Engineering
Type: BOOK - Published: 2010-09-09 - Publisher: Springer Science & Business Media

Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes
Processing-in-Memory for AI
Language: en
Pages: 165

Processing-in-Memory for AI

Authors: Joo-Young Kim, Bongjin Kim, Tony Tae-Hyoung Kim
Categories: Technology & Engineering
Type: BOOK - Published: 2022-07-29 - Publisher: Springer Nature

This book provides a comprehensive introduction to processing-in-memory (PIM) technology, from its architectures to circuits implementations on multiple memory types and describes how it can be a viable computer architecture in the era of AI and big data. The authors summarize the challenges of AI hardware systems, processing-in-memory (PIM) constraints
Enabling the Internet of Things
Language: en
Pages: 520

Enabling the Internet of Things

Authors: Massimo Alioto
Categories: Technology & Engineering
Type: BOOK - Published: 2017-01-23 - Publisher: Springer

This book offers the first comprehensive view on integrated circuit and system design for the Internet of Things (IoT), and in particular for the tiny nodes at its edge. The authors provide a fresh perspective on how the IoT will evolve based on recent and foreseeable trends in the semiconductor
VLSI Design and Test
Language: en
Pages: 722

VLSI Design and Test

Authors: S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh
Categories: Computers
Type: BOOK - Published: 2019-01-24 - Publisher: Springer

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are

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